SIOM Makes Progress in Spectrally Decoupled Infrared Anti-Counterfeiting Metasurface Film Labels
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An SIOM team designed a Cr/ZnS bilayer metasurface film label enabling independent coding in visible and long-wave infrared channels, with results published in Materials Today Physics. The label's total functional thickness is below 300 nm and requires only mask-assisted thermal evaporation, with no lithography or laser processing. It remains stable at incidence angles up to 70° and is insensitive to TM/TE polarization. After 1,000 bending cycles, the visible appearance and dual-band optical response of the sample were largely preserved.
The study uses a metal-film thickness window to separate visible and long-wave infrared responses, providing a design method for dual-channel anti-counterfeiting labels that combines simplified fabrication with mechanical durability.
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Source: Shanghai Institute of Optics and Fine Mechanics (SIOM) · Research Updates · siom.cas.cn