SIOM Develops Spectrally Decoupled Infrared Anti-Counterfeiting Film
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A team at the Shanghai Institute of Optics and Fine Mechanics designed a Cr/ZnS bilayer metasurface film label that enables independent encoding in visible and long-wave infrared channels. The results were published in Materials Today Physics. The label's total functional thickness is below 300 nm and requires only mask-assisted thermal evaporation, with no lithography or laser processing. It remains stable at incidence angles up to 70 degrees and is insensitive to TM/TE polarization. After 1,000 bending cycles, the sample's visible appearance and dual-band optical response were largely retained.
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- Shanghai Institute of Optics and Fine Mechanics (SIOM) · Research UpdatesPicksSIOM Makes Progress in Spectrally Decoupled Infrared Anti-Counterfeiting Metasurface Film Labels
An SIOM team designed a Cr/ZnS bilayer metasurface film label enabling independent coding in visible and long-wave infrared channels, with results published in Materials Today Physics. The label's total functional thickness is below 300 nm and requires only mask-assisted thermal evaporation, with no lithography or laser processing. It remains stable at incidence angles up to 70° and is insensitive to TM/TE polarization. After 1,000 bending cycles, the visible appearance and dual-band optical response of the sample were largely preserved.
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